The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2001

Filed:

Aug. 03, 1999
Applicant:
Inventors:

Hitoshi Sakano, Yokohama, JP;

Chikaya Iko, Yokohama, JP;

Jun Matsuno, Zushi, JP;

Tatsuro Otaki, Tokyo, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 1/700 ; G03B 1/310 ; G02B 2/136 ;
U.S. Cl.
CPC ...
G03B 1/700 ; G03B 1/310 ; G02B 2/136 ;
Abstract

A photographing unit for a microscope has a photometric detector to measure brightness of light from a sample and includes a changing member which changes a brightness of light toward an observation system and a control unit which controls the light based on a detection output of the photometric detector. In addition, the changing member can be controlled based on the presence of an observer. A shielding member can be provided that automatically shields an optical path of the observation system. An illumination system for an index on a reticle can be provided so that the illumination of the reticle can be performed or extinguished at desired times. Additionally, the color of light with which the index is illuminated may be made distinguishable from the color of light from a sample, and the contrast of the index to the sample can be controlled.


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