The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2001
Filed:
Jul. 16, 1998
Applicant:
Inventors:
Eric Larkin, San Jose, CA (US);
Ana Chang, Mountain View, CA (US);
David Rinaldis, Sunnyvale, CA (US);
Helen Shaughnessy, Palo Alto, CA (US);
Assignee:
Silitek Corporation, Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 ;
U.S. Cl.
CPC ...
H04N 1/04 ;
Abstract
This invention relates to a scanning device for scanning a document such as a photograph using an image sensor device that uses optics that may have a narrow depth of focus, the scanning avoiding contact of the document by the image sensor device during scanning. That is, the focal volume of the sensor device is at a distance from the image sensor device. The scanning device includes a positioning mechanism that maintains the front surface of the document in the focal volume during scanning.