The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2001

Filed:

Aug. 20, 1999
Applicant:
Inventors:

David John Watson, Hanley Swan, GB;

Clive Patrick Ashley Catterall, Malvern Wells, GB;

Duncan Edward Stephenson, Worcester, GB;

Assignee:

Malvern Instruments Limited, Worcesterchire, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

A particle size distribution analysis apparatus wherein there are provided a sample measurement zone adapted to contain a sample of particles, a light emitting means adapted to provide a source of light incident upon the measurement zone, and a detection means adapted to measure light levels at different scattering angles and to output signals to a computation means, enabling the size of particles contained within the sample to be determined, wherein the light emitting means comprises a first light source emitting a substantially monochromatic first wavelength of light and a second light source emitting a substantially monochromatic second, different, wavelength of light.


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