The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2001
Filed:
Dec. 03, 1998
Neven Pischl, Santa Clara, CA (US);
John Lockwood, Dublin, CA (US);
Nortel Networks Limited, Montreal, CA;
Abstract
According to one embodiment of the present invention, a voltage probe for measuring common-mode (CM) voltage of a device under test (DUT) having differential input/output (I/O) signals is disclosed. The probe includes a connector adapted to couple to the DUT, at least one output measurement port configured to connect to a measuring device for measuring the CM voltage, and at least one differential pair cable connected to a connector and to a at least one measurement port for coupling a differential I/O signals to a measurement port. According to a second embodiment, the present invention provides a voltage probe for measuring CM voltage of a DUT having differential I/O signals while the DUT is simultaneously connected to an auxiliary equipment. According to a third embodiment, the present invention provides a method for measuring EMI from a DUT. A CM voltage probe is interposed between the DUT and an EMI measurement device. The CM voltage is measured at an measurement port of the voltage probe. The measured CM voltage is compared to a limit for EMI.