The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2001
Filed:
Dec. 01, 1998
Li-Sen Chen, Kaohsiung, TW;
Hung-Ju Yen, Hsinchu, TW;
Chih-Ming Wu, Taipei, TW;
Wei-Tai Jao, Hsinchu, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A calibration instrument for micro-positively-sensed force, including: a platform support stand having a base with a vise thereon for clamping an elastically deformable strain measuring device to be calibrated, a micro-distance meter at an upper portion of the platform support, a probe connected to and positioned beneath the micro-distance meter, displacement of the probe in vertical direction being adjustable through the micro-distance meter, the probe having a load cell. The load cell and elastically deformable strain measuring device to be calibrated are each connected to a signal transmitting device which outputs the signals thererof to a signal amplifying device so as to display the signals being measured. And, a method for calibrating a calibration instrument for micro-positively-sensed force that uses the calibration instrument to calibrate a precision measuring device.