The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2001

Filed:

Jul. 17, 1998
Applicant:
Inventors:

Frank P. Higgins, West Trenton, NJ (US);

Ilyoung Kim, Plainsboro, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 2/900 ;
U.S. Cl.
CPC ...
G11C 2/900 ;
Abstract

Memory test hardware is provided for generating signals for testing a first memory array and a second memory array. The first memory array and the second memory array may be any two of main memory array, a spare memory array, and reconfiguration memory array, or the apparatus may be adapted for testing all three memory arrays. The memory test hardware may include a controller for generating control signals, a data generator coupled to the controller for generating data signals, and an address generator coupled to the controller for generating address signals. The test device may further include an output data evaluator and repair unit for receiving signals from the main memory array and the spare memory array and for detecting faults in those arrays.


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