The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2001
Filed:
Feb. 02, 1998
Ronald Dean Watkins, Niskayuna, NY (US);
Charles Lucian Dumoulin, Ballston Lake, NY (US);
Robert David Darrow, Scotia, NY (US);
Christine Elise Dumoulin, Ballston Lake, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
An invasive probe for mapping the walls of a lumen employs a real-time tracking means and a wall distance measurement means. As the probe is advanced within the lumen, the real-time tracking means provides three-dimensional coordinates of the probe's position and orientation. Concurrent with probe localization, the distance between the probe and the lumen walls is measured. Both the probe position and the wall distance measurement are sent to a data acquisition system which in turn provides a graphic or numeric display to the operator. Probe tracking can be performed with radio-frequency, magnetic resonance, ultrasonic techniques or the like. If desired, lumen wall distance measurements can be performed with magnetic resonance or ultrasound methods. Lumen wall distance measurements can also be performed with mechanical devices such as balloons and/or expanding structures.