The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2001
Filed:
Mar. 19, 1999
Christopher A. Cook, Philadelphia, PA (US);
Warren Groner, Great Neck, NY (US);
Richard G. Nadeau, North East, MD (US);
Cytometrics, Inc., Philadelphia, PA (US);
Abstract
The invention comprises a system and method of calibrating a reflected spectral imaging apparatus used for analysis of living tissue. In addition to the reflected spectral imaging apparatus itself, the calibration apparatus comprises an optical filter that is placed between the light source used in the imaging apparatus and the object under analysis, and a calibration module. The filter is fabricated such that when the light is passed through the filter, an image is projected onto the focal plane where imaging is to take place within the object. The image projected by the filter comprises a plurality of areas, each having a different known optical density. For each area, the calibration module measures the intensity of the light reflected from the area and maps the light intensity measurement to the optical density known to be present at the area. This correspondence of light intensity measurements and known optical densities is then used to calibrate the reflected spectral imaging apparatus.