The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2001
Filed:
Feb. 03, 1999
Masao Sato, Chiba, JP;
Seiko Instruments Inc., , JP;
Abstract
In order to improve detection efficiency and angular detection characteristics of an in-line X-ray film thickness monitor for monitoring the film thickness of a coated part during production of a product formed using the coated part, the film thickness monitor is provided with an X-ray tube of an end-window type for irradiating an X-ray beam onto the coated part, and an X-ray detector having an annular detecting plane arranged coaxially with the axis of irradiation of the X-ray beam. The X-ray detector detects fluorescent X-rays emitted by the coated part in response to irradiation thereof by the X-ray beam so that the thickness of the coating film can be determined based upon the intensity of the detected fluorescent X-rays.