The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2001
Filed:
Apr. 20, 1999
Peter Michael Edic, Albany, NY (US);
Armin Horst Pfoh, Niskayuna, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
The present invention, in one form, is a system for reducing contribution of scatter signal to an image of an object constructed from projection data acquired during a computed tomography scan. The system includes an x-ray source which emits an x-ray beam toward a detector array. A collimator plate is movable with respect to the detector array. The system is configured to move the collimator between a first position and a second position. In the first and second positions, the collimator does not cover the detector array, i.e., the collimator does not collimate the x-ray beam impacting the detector array. When moving between the first and second positions, the collimator at least partially covers the detector array, i.e., the collimator at least partially collimates the x-ray beam impacting the detector array. A first signal intensity at the detector array is obtained when the collimator is in the first position and a second signal intensity at the detector array is obtained when the collimator is moved between the first and second position. The determined signal intensities are then utilized to determine the scatter signal of the x-ray beam and to generate substantially uncorrupted projection data.