The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2001
Filed:
Apr. 25, 1997
Applicant:
Inventors:
Anne Elizabeth Gattiker, Chambersburg, PA (US);
Wojciech Maly, Pittsburgh, PA (US);
Assignee:
Carnegie Mellon University, Pittsburgh, PA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/106 ;
U.S. Cl.
CPC ...
G01R 3/106 ;
Abstract
A method of using static power supply current in response to test vectors for acceptance testing and defect diagnosis of CMOS integrated circuit die. Testing is based on comparison of two or more power supply current measurements from the die under test. Defect diagnosis is based on characterizing a defect by one or more current levels produced by the circuit in the presence of the defect.
Gattiker, Anne. (2001). Current signatures for iddq testing (U.S. Patent No. 6175244). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6175244
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile