The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2001

Filed:

Mar. 17, 1999
Applicant:
Inventor:

Don L. Lin, Neshanic Station, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/760 ; G01R 2/912 ;
U.S. Cl.
CPC ...
G01N 2/760 ; G01R 2/912 ;
Abstract

This invention relates to a system and method for economically locating an ESD event with a reasonable degree of accuracy. It performs this function using a binary approach in which one or more binary ESD locator boxes are used. Each of these binary ESD locator boxes incorporates two antennas and performs the function of determining which of these antennas receives the ESD signal first. This determination establishes the ESD event as occurring to one side of a planar surface. By incorporating one or more additional binary ESD locator boxes, the system can determine whether an ESD event occurred within a two dimensional area or within a three dimensional area.


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