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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6175092 B1

PDFFull Text
Date of Patent:
Jan. 16, 2001

Filed:

Sep. 30, 1998

Method and apparatus for classifying batches of wood chips or the like

Applicant:
Inventors:

Sylvain Binette, Saint-Louis de France, CA;

Jacques Labb{acute over (e)}, Sainte-Foy, CA;

Pierre B{acute over (e)}dard, Charlesbourg, CA;

Jean-Pierre Couturier, Sainte-Foy, CA;

Assignee:

Centre de Recherche Industrielle du Qu{acute over (e)}bec, Sainte-Foy, CA;

Attorney:

Swabey Ogilvy Renault

Primary Examiner:

Tuan N Nguyen

Int. Cl.
CPC ...
B07C 5/00 ; G01J 5/02 ;
U.S. Cl.
CPC ...
B07C 5/00 ; G01J 5/02 ;
Abstract

A method and apparatus for classifying batches of wood chips or the like according to light reflection characteristics; provide optimal use of darker wood chips in pulp and paper processes. According to a preferred embodiment, light produced by a set of illumination sources is evenly directed onto superficial wood chips of an inspected batch portion transported on a conveyor while being inspected by a camera disposed over the conveyor. The superficial wood chips presenting light reflection characteristics being substantially representative of the wood chips of the inspected batch, reflected light is sensed by the camera to produce electrical signals representing rejection intensity values for the wood chips of the batch portion. From the electrical signals produced, image processing is performed to provide global reflection intensity data for the inspected batch, which are then compared with reference reflection intensity data to provide classification of the inspected wood chips batch into proper wood chips grade according to its light reflection characteristics.

Find Patent Forward Citations

Binette, Sylvain. (2001). Method and apparatus for classifying batches of wood chips or the like (U.S. Patent No. 6175092). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6175092

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