The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2001

Filed:

Jun. 08, 1998
Applicant:
Inventor:

Hai-Shene Chen, Toronto, CA;

Assignee:

ACGT Medico Inc., Toronto, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/3566 ; G01N 3/353 ; C12Q 1/68 ; C07H 1/900 ; B01D 1/508 ;
U.S. Cl.
CPC ...
G01N 3/3566 ; G01N 3/353 ; C12Q 1/68 ; C07H 1/900 ; B01D 1/508 ;
Abstract

Methods are disclosed for detecting the presence of at least two predetermined known materials in a test sample. At least one of the predetermined known materials is a control material. The test sample is introduced into a test column which has a snare for each predetermined known material. Each snare has a capture material specific to the associated predetermined known material, and the capture material will bind with the associated predetermined known material to form a bound material. The test column is then washed to remove any materials which have not been bound to the capture materials. Finally, the presence of bound materials is detected on each of the snares. The method is useful for pathogens, DNA and RNA.


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