The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2001
Filed:
Mar. 04, 1999
Carl Andrew Reis, Torrance, CA (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
A method for repairing a multi-layered damage area in a multi-layered composite structure. The method first includes obtaining depth measurement data, and obtaining topographical measurement data by laser scanning the surface of the damage area. This depth measurement data and topographical measurement data are inputted into a microprocessor along with thickness data of each layer. All inputted information is correlated among itself to thereby internally produce a three-dimensional damage area display-replica and interpolate a two-dimensional pattern of each layer of the damage area and of the surface of the damage area. The damage area is removed by first projecting a two-dimensional laser pattern of the damage area thereat on the surface of the structure, and thereafter manually removing the area to produce a void. Repair is accomplished by projecting onto respective replacement material a two-dimensional laser image pattern of each layer and manually cutting that layer according to the appropriate pattern. The cut layers then are arranged in accord with construction of the removed damage area to form a plug that is placed within the void.