The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2001

Filed:

Jun. 22, 1998
Applicant:
Inventor:

Tsuneo Tsukagoshi, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract

An apparatus and a method for checking that an electronic circuit device or an electronic circuit component such as an LSI operates normally or abnormally by applying an input pattern to the electronic circuit device or the electronic circuit component together with electromagnetic noises before comparing an obtained output pattern with an expected pattern so as to judge whether or not the patterns match in order to evaluate immunity to electromagnetic noises (conductive or radiation noises).


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