The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2001
Filed:
Feb. 24, 1998
Masaru Sanada, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
A method of locating faults occurred in an LSI (Large Scale Integrated Circuit) is disclosed. Block-by-block logic information each varying in accordance with a test vector are output by dump processing using logic simulation on the basis of circuit connection information. The block-by-block logic information varying in accordance with the test vector are combined with Iddq information showing whether or not an Iddq error has occurred test vector by test vector. These information are used to execute calculation with each block on a test vector basis. As a result, a block involving a fault is detected. Subsequently, a fault is located in the fault block on a transistor basis by use of logic information showing whether or not the Iddq error is present in the block.