The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2001

Filed:

Sep. 25, 1998
Applicant:
Inventors:

Mike Lowe, Austin, TX (US);

Mark LaVine, Austin, TX (US);

Jelena Ilic, Austin, TX (US);

Paul Berndt, Austin, TX (US);

Tahsin Askar, Austin, TX (US);

Enrique Rendon, Pflugerville, TX (US);

Hamilton Carter, Austin, TX (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/300 ;
U.S. Cl.
CPC ...
G06F 1/300 ;
Abstract

A system and method for memory incoherent verification of functionality of an HDL (Hardware Description Language) design of a computer system component is disclosed. A simulated model of the HDL design receives a memory read stimulus from a stimulus file through a simulated first bus. The simulated model of the HDL design is configured to send its response to the stimulus onto a simulated second bus. A transaction checker receives the response from the simulated second bus and analyzes it to verify operation of the HDL design of the computer system component. The stimulus file and the transaction checker are both stored in the computer system memory. The simulated model's response to the memory read stimulus is evaluated by the transaction checker independently of any previous memory write stimulus from the stimulus file. There is no need to have a previous memory write operation or a master initialization of the system memory for every memory read operation. This enhances the sequences of operations that may be applied to a device under test. Multiple simulated models may read or write into the memory without timing constraints.


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