The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2001
Filed:
Mar. 31, 1999
Jung Young Son, Kyunggi-do, KR;
Vadim V. Smirnov, Saint-Petersburg, RU;
Hyung Wook Jeon, Seoul, KR;
Yong Jin Choi, Seoul, KR;
Korea Institute of Science and Technology, Seoul, KR;
Abstract
An apparatus for simultaneously measuring in real time for a reflection-type holographic optical element the wavelength of maximum diffraction efficiency, the angular and spectral selectivities, and the direction of the grating vector by analyzing the characteristics of the intensity distribution of the transmitted beam. A diverging or diffusive beam having an angle of divergence greater than the incident angle satisfying the Bragg condition of the holographic optical element under measurement. The apparatus comprises a multi-wavelength oscillation laser beam source, a beam diffuser, a objective lens, and an image projection screen.