The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2001
Filed:
Aug. 05, 1997
Masamitsu Haruna, Toyonaka, JP;
Hideki Maruyama, Chikushino, JP;
Matsushita Electric Industrial Co., Ltd., Kadoma, JP;
Abstract
Light from a light source is converged by a converging lens and is irradiated to an object to be measured through a converging lens, the object to be measured or the converging lens and the reference light mirror are displaced so as to maximize intensities of interference light at the reference light mirror and the front and rear surfaces of the object to be measured, and displaced distances of the object to be measured or the converging lens and the reference light mirror at a position where an intensity of interference light becomes maximum at the rear surface and a position where an intensity of interference light becomes maximum are obtained in order to simultaneously measure a refractive index and a thickness of the object to be measured. With this arrangement, simultaneous measurement of a phase index and a thickness of an object to be measured, simultaneous measurement of a birefringence and a thickness of an object to be measured, and a phase index and a group index of an object to be measured can be carried out.