The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2001
Filed:
Dec. 28, 1998
Richard Allen Sones, Cleveland Hts, OH (US);
Amir Reza Novini, Akron, OH (US);
Applied Vision, Akron, OH (US);
Abstract
The invention is directed to a process of inspecting a container wherein a container is positioned at a predetermined location for inspection. At least a portion of the container is illuminated over a defined finish surface, which can relate to various complete surfaces of the container design. Illuminating light is captured from an area corresponding to the defined finish surface without physical manipulation of the container. Thereafter, it is determined whether the defined finish surface of the container is within predetermined tolerances, which then can be used for quality control or other purposes. An apparatus in accordance with the invention preferably has a source of illuminating light to direct light over defined finish surface of the container, and a light sensor to capture light from an area corresponding to at least the defined finish surface. The light sensor provides image information relating to the defined finish surface, and a processor allows determination of whether the defined finish surface is within the predetermined tolerance.