The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2001
Filed:
Feb. 19, 1998
Richard James Evans, Underhill, VT (US);
David Frank Heidel, Mahopac, NY (US);
Jeffrey Alan Kash, Pleasantville, NY (US);
Daniel Ray Knebel, Carmel, NY (US);
James Chen-Hsiang Tsang, White Plains, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Methods for the ready identification of dynamic defects using switching induced light emission from CMOS gates in complex integrated circuits such as microprocessors are described. The rapid increase in the complexity of logic circuits means that practical gate level identification of the sources of dynamic errors will require methods other than the gate by gate tracing of every possible path taken by a given set of instructions. The methods described here are based on the ability of picosecond imaging circuit analysis to detect the switching activity of every gate of a complex circuit in a single, passive measurement, and the ability of data processing today to compare large two- and three-dimensional files.