The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2001

Filed:

Nov. 10, 1997
Applicant:
Inventors:

Fumio Ohtomo, Tokyo, JP;

Kazuaki Kimura, Tokyo, JP;

Vernon J. Brabec, Pleasanton, CA (US);

Satoshi Hirano, Pleasanton, CA (US);

Makoto Omori, Pleasanton, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E01C 2/307 ;
U.S. Cl.
CPC ...
E01C 2/307 ;
Abstract

An automatic control system for a construction machine includes the construction machine provided with a ground leveling implement, a target, and a laser sensor; a survey unit that has a coordinate position measuring element and projects a beam of tracking light indicating a finished-plane height toward the target; a storage unit for storing finished-plane height data in correspondence with a horizontal coordinate position in the coordinate position; and a computation unit for computing the finished-plane height data. The survey unit is equipped with a rotation unit for rotating the laser beam in a vertical direction so that a height of the laser beam at the horizontal coordinate position becomes a height from a determined finished plane. The construction machine is provided with a control unit for controlling the ground leveling implement so that it reaches the finished-plane height, based on a position at which the laser beam is received on the laser sensor. The computation unit computes a vertical deviation between a predetermined vertical position of the target and an actually measured value thereof.


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