The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2001
Filed:
Apr. 23, 1998
Applicant:
Inventors:
J{umlaut over (u)}rgen Schawe, Blaustein, DE;
Marcel Margulies, Scarsdale, NY (US);
Assignee:
PerkinElmer Instruments LLC, Norwalk, CT (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/500 ;
U.S. Cl.
CPC ...
G01N 2/500 ;
Abstract
The invention is directed to a differential analysis method and apparatus wherein a sample and reference are subjected to an externally applied disturbance, such as temperature change, in accord with a prescribed function comprising the sum of a linearly changing part and a periodically changing part, and the measured differential signal is processed into real and imaginary components relating, respectively, to the energy storage and energy loss portions of the signal.