The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2001
Filed:
Apr. 13, 1998
Milton Wayne Demaray, Fremont, CA (US);
William Gary Cox, Mountain View, CA (US);
Hitachi Data Systems Corporation, Santa Clara, CA (US);
Abstract
A standardized test environment assists identifying problematic instances of instructions in computer programs that produce erroneous results. A standardized production environment takes corrective action for selected instructions by intercepting instruction processing during instruction fetch, instruction decode or instruction execution and modifying one or more values such that the instructions achieve correct results. In one embodiment of a test environment, a computer system collects diagnostic information for designated instructions such as subtraction operations that produce negative results. In one embodiment of a production environment, a computer system intercepts instruction processing for instructions at specified locations in a program and takes corrective action according to information obtained from a table of control information.