The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2001

Filed:

Jul. 27, 1998
Applicant:
Inventor:

Paul K. Wheeler, Allentown, PA (US);

Assignee:

Lucent Technologies, Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G01R 3/102 ;
Abstract

A systematic method for assigning tester channels on an Automated Test Equipment (ATE) to various signal pins on Device Under Test (DUT). The method involves creating a test fixture or a load board for a digital Integrated Circuit (IC) by wiring the DUT pins to as few channel groups as possible. The number of channel groups required for each vector set load are calculated before the signal pins are assigned. Then, the signal pins are assigned in a systematic manner to the fewest number of channel groups. As the number of test channel groups is reduced, the amount of vector data loaded into the tester's vector memory before each test vector is executed also is reduced, therefore reducing the time and cost required to test the signal pins on the DUT.


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