The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2001
Filed:
Nov. 09, 1998
Martin I. Grace, San Jose, CA (US);
William W. Oldfield, Redwood City, CA (US);
Anritsu Company, Morgan Hill, CA (US);
Abstract
A wafer probe with built in components to perform frequency multiplication, upconversion, downconversion, and mixing typically performed by an RF module of a vector network analyzer (VNA). The wafer probe is designed for testing integrated circuits used in collision avoidance radar systems and operates over the 76-77 GHz frequency range allocated by the Federal Communications Commission (FCC) for collision avoidance radars. To minimize costs, the wafer probe preferably utilizes integrated circuits for frequency multiplication, upconversion, downconversion, and mixing manufactured for collision avoidance radar systems.