The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2001

Filed:

Sep. 03, 1998
Applicant:
Inventor:

William K. Warburton, Menlo Park, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/24 ;
U.S. Cl.
CPC ...
G01T 1/24 ;
Abstract

A method for obtaining both spatial and energy resolution in compound semiconductor x-ray detectors using charge carriers of only a single polarity. A negatively biased cathode contact is applied to one side of a block detector material and an array of anode stripes is applied to the other side. Absorbed x-rays generate charge clouds in the detector block, and charge sensitive preamplifiers measure the time varying charges q,(t) induced on the anodes by the motion of these charge clouds within the detector. For each stripe j, one or more secondary signals Q,(t) are formed as weighted sums of the signals q,(t) from the stripe j and a combination of its near neighbors. One or another of these signals Q,(t) can then be processed to obtain the energy of the absorbed x-ray, the position where it was absorbed, both laterally and in depth, and the time of the absorption.


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