The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2001
Filed:
Apr. 30, 1999
Shiaw-Min Chen, San Jose, CA (US);
Cheryl R. Heiner, La Honda, CA (US);
Adam L. Lowe, San Francisco, CA (US);
The Perkins-Elmer Corporation, Foster City, CA (US);
Abstract
The invention relates to improved methods and compositions for loading samples into an analytical instrument having a plurality of sample receiving loading ports. In a principle embodiment of the invention, first and second sample markers are added to sample to be loaded onto an analytical instrument having a plurality of sample receiving loading ports. The first and second samples are compounds are selected so as to produce a distinctive signal upon combination thus a sample containing a first sample marker and a sample containing a second marker are mistakenly loaded into the same sample receiving loading port, a detectable signal indicative of the misloading is produced.