The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2001

Filed:

Jan. 08, 1999
Applicant:
Inventors:

Akiva Vexler, Hod Hasharon, IL;

Raphael Gorodetsky, Jerusalem, IL;

Igor Polyansky, Bnev Aish, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/103 ; A61B 5/117 ;
U.S. Cl.
CPC ...
A61B 5/103 ; A61B 5/117 ;
Abstract

A probe for examining viscoelasticity and anisotrophy of an area of an external layer of a living or artificial tissue, comprises an assembly (,) including at least one group of piezoelectric spaced-apart transducers (,), each having a surface contact making edge, wherein one of said transducers operates as a transmitter and at least one other transducer operates as a receiver, and wherein said assembly is movable both axially, as well as angularly; means for effecting the controlled axial movement (,) of said assembly; means for controlling the contact pressure (,) to be exerted by the transducers on the surface of an area of a tissue to be examined, and means for effecting angular movement of said assembly (,) at a selected axial displacement.


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