The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2001

Filed:

Jul. 07, 1998
Applicant:
Inventors:

Stephan Hepner, Alth{umlaut over (a)}usern, CH;

Andrew Wihler, Ennetbaden, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F02C 9/00 ;
U.S. Cl.
CPC ...
F02C 9/00 ;
Abstract

In a control system for controlling at least one variable (TIT,) of a process, the at least one variable (TIT,) being calculated from a multiplicity of measured process variables (TAT,, p,), the measured process variables (TAT,, p,) in each case being measured via associated measuring sections (,), the transfer functions (G,(s), G,(s)) of which have a different time response, an improvement in particular during transient actions is achieved in that, to avoid instability, correction means (,) which equalize the different time responses of the individual measuring sections (,) are provided.


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