The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2000
Filed:
Jan. 09, 1997
Mark A Sapia, Canton, CT (US);
James C Schaff, Cheshire, CT (US);
Ian R Greenshields, Mansfield Center, CT (US);
Leslie M Loew, W. Hartford, CT (US);
Frank R Morgan, W. Hartford, CT (US);
The University of Connecticut, Storrs, CT (US);
Abstract
An adaptive structure of a Wiener filter is used to deconvolve three-dimensional wide-field microscope images for the purposes of improving spatial resolution and removing out-of-focus light. The filter is a three-dimensional kernel representing a finite-impulse-response (FIR) structure requiring on the order of one thousand (1000) taps or more to achieve an acceptable mean-square-error. Converging to a solution is done in the spatial-domain and therefore does not experience many of the problems of frequency-domain solutions. Alternatively, a three-dimensional kernel representing an infinite-impulse-response (IIR) structure may be employed. An IIR structure typically requires fewer taps to achieve the same or better performance, resulting in higher resolution images with less noise and faster computations.