The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2000

Filed:

Dec. 03, 1998
Applicant:
Inventors:

Joji Nakayama, Tokyo, JP;

Atsushi Katayama, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356376 ;
Abstract

A method and apparatus for precision distance measurement are provided to perform accurate measurement of distance to an object according to light spots formed on the light receiving surface of a detector even when multiple reflections are involved. A beam of light emitted from a light source and reflected from the object is focused on the viewing surface as light spots through an optical member. The focal position of a reflected beam of light is determined according to a focal position detection process. When there are peaks in a luminosity curve generated on the detector, prior to performing the focal position detection process, the peaks are separated into individual light spots and a correct light spot for deriving the precise distance is selected by a selection process.


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