The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2000
Filed:
Apr. 18, 1996
Victor Vali, Laguna Hills, CA (US);
I-Fu Shih, Los Alamitos, CA (US);
David B Chang, Tustin, CA (US);
Raytheon Company, Lexington, MA (US);
Abstract
A fiber optic interferometric sensor (150) having constantly high sensitivity by use of two lasers (152, 154) that simultaneously output at first and second wavelengths. By judicious choice of the wavelengths, the optical path length difference between the two interferometer paths (164, 166) can be kept near the maximum slope of the interference fringes for one or the other of the wavelengths. The output from the interferometer (160) is divided between first and second detector arms (170, 130). A filter (172) in the first detector arm passes the first wavelength and rejects the second. A filter (182) in the second detector arm passes the second wavelength and rejects the first. A first detector (174) at the output of the first detector arm reads the interference pattern at the first wavelength. A second detector arm reads the interference pattern at the second wavelength.