The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2000
Filed:
Feb. 19, 1998
Patrick Y Hwang, Marion, IA (US);
Rockwell International Corporation, Milwaukee, WI (US);
Abstract
A system and method of detecting and correcting for cycle slip in a GPS attitude determination system is presented. The method employs several techniques for detecting and correcting for faults in high integrity carrier phase-related applications. A delta single difference is used as a primary measurement residual in detecting cycle slip. The delta single difference represents the difference in phase of a carrier signal of a GPS satellite at two receiving antennas over two points in time. This delta single difference is compared to a detection failure threshold computed based on certain high integrity needs. Satellites showing a failure are excluded. In addition, satellites that fail a detectability test, indicating the inability to detect a fault, are pre-excluded from attitude solution computation. When re-resolving integer ambiguities associated with fault detection and correction, the method ensures that the integer ambiguity is resolvable via a resolvability algorithm before implementing a solution-based integer ambiguity resolution.