The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2000
Filed:
Oct. 12, 1999
Applicant:
Inventors:
Bentley N Scott, Garland, TX (US);
Samuel R Shortes, Highland Village, TX (US);
Assignee:
Phase Dynamics Inc., Richardson, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
324637 ; 324602 ; 324 711 ; 422 8201 ; 426231 ;
Abstract
A process for monitoring the state of microcrystalline change of solid materials, by observing the frequency of a load-pull oscillator which is RF-coupled to the material under test (preferably by a simple single-ended RF probe). Areas where this technique is of particular interest are in monitoring the curing of shaped aerodynamic composite materials, and in monitoring the curing of concrete and cement compositions.