The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2000

Filed:

Dec. 22, 1998
Applicant:
Inventors:

Jason A Polzin, Lake Mills, WI (US);

Matthew A Bernstein, Rochester, MN (US);

Thomas K Foo, Rockville, MD (US);

Assignee:

General Electric Company, Milwaukee, WI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
324309 ; 324309 ; 324307 ;
Abstract

A system and method is disclosed to combine both a fractional echo (k.sub.x) and a fractional NEX (k.sub.y) to reduce acquisition times and echo times in MR imaging. The method uses both zero-filling and homodyne reconstruction to construct concurrent fractional NEX and fractional echo data in a single image while minimizing any blurring effects. The system includes acquiring partial MRI data in the k.sub.x direction and acquiring partial MRI data in the k.sub.y direction. Once a partial echo and a partial NEX are acquired, the missing data is first zero-filled in the k.sub.x direction and Fourier transformed to acquire a full x direction data set. Next, the data is synthesized in the k.sub.y direction using a homodyne reconstruction technique to acquire a full data set in the k.sub.y direction. The full x,y data set can then be used to reconstruct an MR image with reduced acquisition and echo times. In order to minimize the effects of blurring in the resulting MR image, it is preferable to acquire at least an 80% fractional echo and a 60% fractional NEX. The system can be extended to any number of desirable dimensions.


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