The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2000

Filed:

Dec. 30, 1998
Applicant:
Inventor:

Makoto Kamioka, Kasuga, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ; H04N / ;
U.S. Cl.
CPC ...
250235 ; 358474 ;
Abstract

A multi-beam scanning device in which generation of differences in scanning speed and curved image planes among a plurality of beams is prevented and pitch adjustment for the plurality of beams in the sub-scanning direction can easily be performed. Cylindrical lenses are provided on respective optical paths extending from a plurality of light sources to a beam splitter, and positions of the cylindrical lenses are adjusted by optical path correcting mechanisms for adjustment of position of the respective beams in the sub-scanning direction. A sensor section receives the respective beams to output to a control circuit a detection signal corresponding to a light receiving position. The control circuit drives an optical path correcting drive circuit based on a predetermined threshold and the output signal to control actions of the optical path correcting mechanisms.


Find Patent Forward Citations

Kamioka, Makoto. (2000). Multi-beam scanning device (U.S. Patent No. 6166376). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6166376

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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