The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2000

Filed:

Sep. 09, 1999
Applicant:
Inventor:

Roy D Allen, Burlington, MA (US);

Assignee:

Agfa Corporation, Wilmington, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J / ;
U.S. Cl.
CPC ...
400 74 ;
Abstract

A system and method for detecting imaging parameters includes forming a first image generated with pseudorandom noise and a second image generated with the same pseudorandom noise that serve as an imaging parameter sensor when the first and second images are superimposed. The sensor is useful for visually detecting such imaging parameters such as geometric errors. In one embodiment, the first and second patterns are generated with pseudorandom noise by modulating a repetitive pattern with pseudorandom noise. In another embodiment, the first and second patterns are generated with pseudorandom noise by forming a pseudorandom image and the reverse of the image, and phase shifting one or both of the images.


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