The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2000
Filed:
Jun. 02, 1998
Wai Laing Lee, Austin, TX (US);
Axel Thomsen, Austin, TX (US);
Lei Wang, Austin, TX (US);
Dan Kasha, Austin, TX (US);
Cirrus Logic, Inc., Austin, TX (US);
Abstract
A high performance test signal generator uses a digital to analog converter which converts an N-bit digital signal, such as provided by a computer waveform generator or by a CDROM into an M-bit upsampled digital signal. The M-bit digital signal is applied to an M-bit digital to analog converter to produce an analog output signal. The analog output signal is sampled and fed back across, the discrete time/continuous time interface to the input of the conversion circuit. The test signal generator has very low power consumption yet meets very strict noise and linearity requirements. The test signal generator can be used for testing seismic sensors such as geophones or hydrophones.