The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2000

Filed:

Sep. 27, 1999
Applicant:
Inventors:

Alwin J Tsao, Garland, TX (US);

Paul M Gillespie, Allen, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438687 ; 438633 ; 438637 ; 438643 ; 438675 ;
Abstract

A method for forming copper interconnect lines using a damascene process. After the formation of the copper seed layer (112) and prior to the formation of the copper layer (120), a pattern (114) is formed to block the formation of the copper in non-interconnect areas. The copper layer (120) is then formed and the pattern (114) is removed. The exposed seed layer (112) and any barrier layers (110) thereunder are removed. Finally, the copper layer (120) is chemically-mechanically polished


Find Patent Forward Citations

Tsao, Alwin. (2000). Method to optimize copper chemical-mechanical polishing in a copper (U.S. Patent No. 6162728). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6162728

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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