The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2000

Filed:

Aug. 24, 1998
Applicant:
Inventors:

Robert W Tait, Brighton, MI (US);

Alvaro D Lewin, Austin, TX (US);

Mark R DeYong, Round Rock, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F21V / ;
U.S. Cl.
CPC ...
362249 ; 362283 ; 362347 ; 362350 ; 362800 ;
Abstract

An illumination system and method for providing wide angle illumination to objects to be inspected. The illumination system includes a dome light array having a plurality of rows where each row includes a plurality of lamps arranged in an arc about an imaging area (so that each lamp in the row is approximately the same distance from the imaging area) and all of the lamps in a row point to and illuminate the same point within the image area. The illumination system can include an aperture in the top of the dome light array through which a camera can image the object. Positioning each row of lamps in an arc about the image point provides various illumination angles to give a relatively uniform wide angle, yet intense, illumination to enhance automated PWB defect inspection. To further provide illumination, a pair of side panel light arrays having a plurality of lamps can be attached to the sides of the dome light array so that the side lamps provide further vertical illumination on the image area from a horizontal side plane.


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