The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2000
Filed:
May. 28, 1999
Tadashi Uchida, Tokyo, JP;
Tatsuro Otaki, Tokyo, JP;
Nikon Corporation, Tokyo, JP;
Abstract
An inverted microscope having a variable stage position, a compact size, excellent operability, and low cost. The inverted microscope includes a detachable stage unit to support a stage on which a specimen is positioned and to support an objective lens facing the specimen. A microscope housing supports the stage, and includes an imaging lens positioned to image a parallel light beam from the objective lens. An observation unit is positioned on the microscope housing to observe the image formed by the imaging lens. An illumination unit, positioned between the microscope housing and the stage unit, irradiates light having a predetermined wavelength toward the specimen, and includes a fluorescent light unit. The illumination unit is detachably mounted to the microscope housing, and the stage unit is detachably mounted to the illumination unit, and a height of the stage with respect to the microscope housing is variable. The height of the stage can be changed when the illumination unit between the microscope housing and the stage unit is removed.