The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2000
Filed:
Nov. 25, 1998
Lewis S Damer, St. Paul, MN (US);
Justin B Stec, Medford, OR (US);
William T McArdle, White City, OR (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
An inspection system for viewing substrate or coated substrate features, wherein a directed light source is projected through a coated substrate onto a viewing surface such that features or irregularities in the substrate or in the coating of the coated substrate are displayed. The inspection system includes a projection system including a light source positioned adjacent the second major surface of the optically transmissive substrate, and a viewing screen positioned adjacent the first major surface of the substrate. The substrate is positioned in optical alignment along an optical path between the light source and the viewing screen such that irregularities in the coated top surface of the substrate can be visually observed on the viewing screen by a user. In one aspect the substrate is coated. Optionally, the directed light source is a laser scanner assembly.