The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2000

Filed:

Jun. 04, 1999
Applicant:
Inventor:

Jeng-Huang Wu, Taipei, TW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03B / ;
U.S. Cl.
CPC ...
3311 / ; 331158 ;
Abstract

A universal crystal-oscillator input/output (I/O) circuit is provided for use with an ASIC (Application Specific Integrated Circuit) device, and which can help enhance the electrostatic discharge (ESD) protection on the ASIC device in Charge Device Mode (CDM). This universal crystal-oscillator I/O circuit can help reduce the total number of I/O components in the ASIC library used to construct the IC device, allowing the design and management of ASIC library to be more simplified and convenient, making ASIC more cost-effective to implement. Moreover, this universal crystal-oscillator I/O circuit can help improve the performance of the oscillator circuit, allowing ASIC designers to have more convenience and flexibility in ASIC design. It can be fast in starting oscillation and low in power consumption. In CDM ESD test, the ESD current flowing into the universal crystal-oscillator I/O circuit would be drained away through the third PMOS transistor or the third NMOS transistor, thus preventing the internal circuitry of the ASIC device from being damaged by the ESD current. This universal crystal-oscillator I/O circuit is therefore able to remove electrostatic electricity accumulated on the IC substrate in CDM ESD test, allowing the ASIC device to easily pass the CDM ESD test.


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