The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2000

Filed:

Oct. 20, 1998
Applicant:
Inventors:

Toshimi Satake, Tokyo, JP;

Yukiko Uehori, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73835 ;
Abstract

A novel method for measurement of dynamic water break resistance capable of predicting a degree of paper-cutting at the time of an offset printing and an apparatus for carrying out this method are provided. Both ends of a specimen paper having a size of short-side of from 3 to 15 mm and a long-side of from 120 to 320 mm are kept by a fixed chuck and a movable chuck positioned with a fixed spun length on a measurement table; from 1 to 30 .mu.l of water is attached from a device unit for automatically attaching water onto a central portion of the specimen paper; after the attachment of water, a load is rapidly applied from the both ends of the specimen paper to measure a tensile strength of the specimen paper at the time of attachment of water; and a tensile strength of the specimen paper at the time of drying, i.e., in a state before the attachment of water, is also measured; and a dynamic water break resistance is displayed and evaluated from a percentage of the tensile strength of the specimen paper at the time of attachment of water to the tensile strength of the specimen paper at the time of drying.


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