The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2000
Filed:
Jul. 09, 1997
Yasuo Saito, Nishinasuno-Machi, JP;
Kazuyuki Ihira, Shiobara-Machi, JP;
Katsuyuki Taguchi, Nishinasuno-Machi, JP;
Tatsuro Suzuki, Utsunomiya, JP;
Hiroaki Miyazaki, Otawara, JP;
Koichi Muraki, Nishinasuno-Machi, JP;
Hiroshi Aradate, Otawara, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
A multi-slice X-ray CT scanner is provided to realize high resolution and a wide scanned region in a slice-thickness direction for an object. In the X-ray CT scanner, an X-ray beam for slice imaging is radiated toward an object and scanned in a predetermined slice-thickness direction, a direction orthogonal to the slice-thickness direction being defined as a channel direction. The scanner comprises a two-dimensional X-ray detector, a data acquisition system, and an electrically combining unit. The detector has a plurality of X-ray detecting elements arranged in a two-dimensional array of both rows in the slice-thickness direction and columns in the channel direction, the detecting elements of each row being arranged in unequal pitches. The data acquisition system has a plurality of data acquiring elements arranged in a two-dimensional array of rows and columns, acquiring signals detected by the two-dimensional X-ray detector, and producing digital data proportional to the detected signals. The electrically combining unit electrically combines more than two columns of all the columns in the array of the X-ray detecting elements into at least two columns of all the columns in the array of the data acquiring elements in accordance with a given slice imaging condition. For example, each row of the array of the data acquiring elements are less in number of elements than each row of the array of the X-ray detecting elements.