The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2000
Filed:
Mar. 23, 1998
Heinz Peter, Ulm, DE;
Ulrich Staaden, Aalen, DE;
Carl-Zeiss-Stiftung, Heidenheim, DE;
Abstract
The invention is directed to a method for controlling a coordinate measuring apparatus in accordance with desired data utilizing a movably journalled probe which continuously scans the surface of a workpiece in a scanning point in a preferred measurement direction (M). Either the probe or the workpiece therefore additionally rotatably journalled about at least one rotational axis having a first alignment. Geometric data are processed which include at least points (Pai, Pbi) on the surface of the workpiece with the points (Pai, Pbi) defining a line to be scanned. Control data (Lai, L.alpha.i and/or Lbi, L.beta.i) from the geometric data are computed for controlling the measuring sequence in such a manner that, for measuring the workpiece, the workpiece and/or the probe are rotated about the rotational axis.