The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2000
Filed:
May. 21, 1999
William R Mueller, Clarks Summit, PA (US);
Lewis R Gensel, Avoca, PA (US);
Peter Van Hoof, Moosic, PA (US);
WEA Manufacturing Inc., Olyphant, PA (US);
Abstract
A system and method are provided that allow an optical media inspection device to detect defects on or in optical media despite the presence of gross deformations in the media that would otherwise interfere with the inspection process. A holding device holds the optical media near the center while it is rotated for inspection. A negative displacement prohibitor impedes any negative displacement of the optical media. A positive displacement inhibitor, i.e., air pressure exerted on the optical media, holds the optical media substantially flat while it is being inspected. A closed-loop feedback system may be used to control the amount of air pressure exerted against the optical media.