The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2000
Filed:
May. 14, 1998
Eric S Young, San Jose, CA (US);
Randy X Zhao, Freemont, CA (US);
Anoop Khurana, Freemont, CA (US);
Roger Niu, San Jose, CA (US);
Dong-Ying Kuo, Pleasanton, CA (US);
Sreenivas R Kottapalli, Milpitas, CA (US);
S3 Incorporated, Santa Clara, CA (US);
Abstract
A dither unit preferably comprises an offset generator, an adjusted coordinate generator and a dither matrix. The offset generator is coupled to receive information about the relative position of the sub-sample being dithered, and in response generates offset values. The output of the offset generator along with the pixel coordinates are provided to the adjusted coordinate generator which generates adjusted coordinate values used by the dither matrix. The adjusted coordinate values along with a color value are received by the dither matrix, which in response, generates a dithered value for the sub-sample that can be stored back in the over sampling buffer for additional computation.